自研板卡ZYNQ7010 V2.1
板卡仿真图：
板卡实物图：
iperf3 网络测试带宽(≥500Mbits/sec)：
DDR测试结果：
测试1000次大文件(500MB)读写无异常。
测试连续写入速度：126MB/s
测试连续读取速度：178MB/s
--Starting Memory Test Application-- NOTE: This application runs with D-Cache disabled.As a result, cacheline requests will not be generated Testing memory region: ps7_ddr_0 Memory Controller: ps7_ddr_0 Base Address: 0x100000 Size: 0x3FF00000 bytes Testing memory region: ps7_ram_1 Memory Controller: ps7_ram_1 Base Address: 0xFFFF0000 Size: 0xFE00 bytes --Memory Test Application Complete-- Successfully ran Memory Test Application ----------------------------------------------------------------- ------------------- ZYNQ DRAM DIAGNOSTICS TEST ------------------ ----------------------------------------------------------------- Select one of the options below: ## Memory Test ## Bus Width = 32, XADC Temperature = 55.8995 's' - Test 1MB length from address 0x100000 '1' - Test 32MB length from address 0x100000 '2' - Test 64MB length from address 0x100000 '3' - Test 128MB length from address 0x100000 '4' - Test 255MB length from address 0x100000 '5' - Test 511MB length from address 0x100000 '6' - Test 1023MB length from address 0x100000 ## Read Data Eye Measurement Test 'r' - Measure Read Data Eye ## Write Data Eye Measurement Test 'i' - Measure Write Data Eye Other options for Write Eye Data Test: 'f' - Fast Mode: Toggles Fast mode - ON/OFF 'c' - Centre Mode: Toggles Centre mode - ON/OFF 'e' - Vary the size of memory test for Read/Write Eye Measurement tests ## Data Cache Enable / Disable Option: 'z' - D-Cache Enable / Disable ## Other options 'v' - Verbose Mode ON/OFF 5Option Selected : 5 Starting Memory Test '5' - Testing 511MB length from address 0x100000... ------------------------------------------------------------------------------------------ TEST WORD ERROR PER-BYTE-LANE ERROR COUNT TIME COUNT [ LANE-0 ] [ LANE-1 ] [ LANE-2 ] [ LANE-3 ] (sec) ------------------------------------------------------------------------------------------ ................................Memtest_0 ( 0: 0) 0 [ 0] [ 0] [ 0] [ 0] 17.8097 ........................................Memtest_s ( 0: 1) 0 [ 0] [ 0] [ 0] [ 0] 11.7098 ........................................Memtest_s ( 0: 2) 0 [ 0] [ 0] [ 0] [ 0] 11.7098 ........................................Memtest_s ( 0: 3) 0 [ 0] [ 0] [ 0] [ 0] 11.7115 ........................................Memtest_s ( 0: 4) 0 [ 0] [ 0] [ 0] [ 0] 11.7104 ........................................Memtest_s ( 0: 5) 0 [ 0] [ 0] [ 0] [ 0] 11.711 ........................................Memtest_s ( 0: 6) 0 [ 0] [ 0] [ 0] [ 0] 11.711 ........................................Memtest_s ( 0: 7) 0 [ 0] [ 0] [ 0] [ 0] 11.7098 ........................................Memtest_s ( 0: 8) 0 [ 0] [ 0] [ 0] [ 0] 11.7098 ................................Memtest_p ( 0: 9) 0 [ 0] [ 0] [ 0] [ 0] 17.424 ................................Memtest_p ( 0:10) 0 [ 0] [ 0] [ 0] [ 0] 17.4228 ................................Memtest_l ( 0:11) 0 [ 0] [ 0] [ 0] [ 0] 18.3134 ................................Memtest_l ( 0:12) 0 [ 0] [ 0] [ 0] [ 0] 18.3235 ................................Memtest_l ( 0:13) 0 [ 0] [ 0] [ 0] [ 0] 18.3134 ................................Memtest_l ( 0:14) 0 [ 0] [ 0] [ 0] [ 0] 18.3193
SD测试结果：
测试100次大文件(500MB)读写无异常。
测试连续写入速度：19.3MB/s
测试连续读取速度：22.1MB/s
ADC测试结果（AD7606C 8ch/16bit/1Msps）：
以上测试波形为100Khz，20Vpp值的Sine波
具体的测试指标和性能待测试。
